1 /* SPDX-License-Identifier: GPL-2.0+ */
3 * Copyright (c) 2013 Google, Inc.
10 #include <linux/bitops.h>
13 * struct ut_stats - Statistics about tests run
15 * @fail_count: Number of tests that failed
16 * @skip_count: Number of tests that were skipped
17 * @test_count: Number of tests run. If a test is run muiltiple times, only one
27 * struct unit_test_state - Entire state of test system
29 * @cur: Statistics for the current run
30 * @total: Statistics for all test runs
31 * @run_count: Number of times ut_run_list() has been called
32 * @start: Store the starting mallinfo when doing leak test
33 * @of_live: true to use livetree if available, false to use flattree
34 * @of_root: Record of the livetree root node (used for setting up tests)
36 * @testdev: Test device
37 * @force_fail_alloc: Force all memory allocs to fail
38 * @skip_post_probe: Skip uclass post-probe processing
39 * @fdt_chksum: crc8 of the device tree contents
40 * @fdt_copy: Copy of the device tree
41 * @fdt_size: Size of the device-tree copy
42 * @other_fdt: Buffer for the other FDT (UTF_OTHER_FDT)
43 * @other_fdt_size: Size of the other FDT (UTF_OTHER_FDT)
44 * @of_other: Live tree for the other FDT
45 * @runs_per_test: Number of times to run each test (typically 1)
46 * @force_run: true to run tests marked with the UTF_MANUAL flag
47 * @old_bloblist: stores the old gd->bloblist pointer
48 * @expect_str: Temporary string used to hold expected string value
49 * @actual_str: Temporary string used to hold actual string value
51 struct unit_test_state {
53 struct ut_stats total;
55 struct mallinfo start;
56 struct device_node *of_root;
59 struct udevice *testdev;
67 struct device_node *of_other;
75 /* Test flags for each test */
77 UTF_SCAN_PDATA = BIT(0), /* test needs platform data */
78 UTF_PROBE_TEST = BIT(1), /* probe test uclass */
79 UTF_SCAN_FDT = BIT(2), /* scan device tree */
80 UTF_FLAT_TREE = BIT(3), /* test needs flat DT */
81 UTF_LIVE_TREE = BIT(4), /* needs live device tree */
82 UTF_CONSOLE = BIT(5), /* needs console recording */
83 /* do extra driver model init and uninit */
85 UTF_OTHER_FDT = BIT(7), /* read in other device tree */
87 * Only run if explicitly requested with 'ut -f <suite> <test>'. The
88 * test name must end in "_norun" so that pytest detects this also,
89 * since it cannot access the flags.
92 UTF_ETH_BOOTDEV = BIT(9), /* enable Ethernet bootdevs */
93 UTF_SF_BOOTDEV = BIT(10), /* enable SPI flash bootdevs */
94 UFT_BLOBLIST = BIT(11), /* test changes gd->bloblist */
98 * struct unit_test - Information about a unit test
100 * @name: Name of test
101 * @func: Function to call to perform test
102 * @flags: Flags indicated pre-conditions for test
107 int (*func)(struct unit_test_state *state);
112 * UNIT_TEST() - create linker generated list entry for unit a unit test
114 * The macro UNIT_TEST() is used to create a linker generated list entry. These
115 * list entries are enumerate tests that can be execute using the ut command.
116 * The list entries are used both by the implementation of the ut command as
117 * well as in a related Python test.
119 * For Python testing the subtests are collected in Python function
120 * generate_ut_subtest() by applying a regular expression to the lines of file
121 * u-boot.sym. The list entries have to follow strict naming conventions to be
122 * matched by the expression.
124 * Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite
125 * foo that can be executed via command 'ut foo bar' and is implemented in
126 * function foo_test_bar().
128 * @_name: concatenation of name of the test suite, "_test_", and the name
130 * @_flags: an integer field that can be evaluated by the test suite
131 * implementation (see enum ut_flags)
132 * @_suite: name of the test suite concatenated with "_test"
134 #define UNIT_TEST(_name, _flags, _suite) \
135 ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = { \
142 /* Get the start of a list of unit tests for a particular suite */
143 #define UNIT_TEST_SUITE_START(_suite) \
144 ll_entry_start(struct unit_test, ut_ ## _suite)
145 #define UNIT_TEST_SUITE_COUNT(_suite) \
146 ll_entry_count(struct unit_test, ut_ ## _suite)
148 /* Use ! and ~ so that all tests will be sorted between these two values */
149 #define UNIT_TEST_ALL_START() ll_entry_start(struct unit_test, ut_!)
150 #define UNIT_TEST_ALL_END() ll_entry_start(struct unit_test, ut_~)
151 #define UNIT_TEST_ALL_COUNT() (UNIT_TEST_ALL_END() - UNIT_TEST_ALL_START())
153 /* Sizes for devres tests */
155 TEST_DEVRES_SIZE = 100,
156 TEST_DEVRES_COUNT = 10,
157 TEST_DEVRES_TOTAL = TEST_DEVRES_SIZE * TEST_DEVRES_COUNT,
159 /* A few different sizes */
160 TEST_DEVRES_SIZE2 = 15,
161 TEST_DEVRES_SIZE3 = 37,
165 * testbus_get_clear_removed() - Test function to obtain removed device
167 * This is used in testbus to find out which device was removed. Calling this
168 * function returns a pointer to the device and then clears it back to NULL, so
169 * that a future test can check it.
171 struct udevice *testbus_get_clear_removed(void);
173 #ifdef CONFIG_SANDBOX
174 #include <asm/state.h>
175 #include <asm/test.h>
178 static inline void arch_reset_for_test(void)
180 #ifdef CONFIG_SANDBOX
181 state_reset_for_test(state_get_current());
184 static inline int test_load_other_fdt(struct unit_test_state *uts)
187 #ifdef CONFIG_SANDBOX
188 ret = sandbox_load_other_fdt(&uts->other_fdt, &uts->other_fdt_size);
194 * Control skipping of time delays
196 * Some tests have unnecessay time delays (e.g. USB). Allow these to be
197 * skipped to speed up testing
199 * @param skip_delays true to skip delays from now on, false to honour delay
202 static inline void test_set_skip_delays(bool skip_delays)
204 #ifdef CONFIG_SANDBOX
205 state_set_skip_delays(skip_delays);
210 * test_set_eth_enable() - Enable / disable Ethernet
212 * Allows control of whether Ethernet packets are actually send/received
214 * @enable: true to enable Ethernet, false to disable
216 static inline void test_set_eth_enable(bool enable)
218 #ifdef CONFIG_SANDBOX
219 sandbox_set_eth_enable(enable);
223 /* Allow ethernet to be disabled for testing purposes */
224 static inline bool test_eth_enabled(void)
228 #ifdef CONFIG_SANDBOX
229 enabled = sandbox_eth_enabled();
234 /* Allow ethernet bootdev to be ignored for testing purposes */
235 static inline bool test_eth_bootdev_enabled(void)
239 #ifdef CONFIG_SANDBOX
240 enabled = sandbox_eth_enabled();
245 /* Allow SPI flash bootdev to be ignored for testing purposes */
246 static inline bool test_sf_bootdev_enabled(void)
250 #ifdef CONFIG_SANDBOX
251 enabled = sandbox_sf_bootdev_enabled();
256 static inline void test_sf_set_enable_bootdevs(bool enable)
258 #ifdef CONFIG_SANDBOX
259 sandbox_sf_set_enable_bootdevs(enable);
263 #endif /* __TEST_TEST_H */