pwm: samsung: Fix a bit test in pwm_samsung_resume()

The PWMF_REQUESTED enum is supposed to be used with test_bit() and not
used as in a bitwise AND.  In this specific code the flag will never be
set so the function is effectively a no-op.

Fixes: e3fe982b2e4e ("pwm: samsung: Put per-channel data into driver data")
Signed-off-by: Dan Carpenter <[email protected]>
Reviewed-by: Uwe Kleine-König <[email protected]>
Reviewed-by: Sam Protsenko <[email protected]>
Signed-off-by: Thierry Reding <[email protected]>

diff --git a/drivers/pwm/pwm-samsung.c b/drivers/pwm/pwm-samsung.c
index 568491ed6829e96b71e6e53c5beefcbd49c814e5..69d9f4577b3479fd6038b7e71cc56cfff48fa7c2 100644 (file)
--- a/drivers/pwm/pwm-samsung.c
+++ b/drivers/pwm/pwm-samsung.c
@@ -631,7 +631,7 @@ static int pwm_samsung_resume(struct device *dev)
                struct pwm_device *pwm = &chip->pwms[i];
                struct samsung_pwm_channel *chan = &our_chip->channel[i];
 
-               if (!(pwm->flags & PWMF_REQUESTED))
+               if (!test_bit(PWMF_REQUESTED, &pwm->flags))
                        continue;
 
                if (our_chip->variant.output_mask & BIT(i))